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UID:6a000eee9ade2@www.leap-up.com
DTSTAMP:20260510T065158Z
DTSTART:20230524T150000
DTEND:20230524T160000
SUMMARY:How Design for Reliability methods support the development of long-living ICs
DESCRIPTION:The reliability of integrated circuits (ICs) and electronic systems is becoming increasingly important. This holds for many application scenarios\, such as automotive\, industrial\, medical\, communication\, etc. Design for Reliability methods allow virtual investigations on the durability of electronics to support the development of reliable ICs and systems. This webinar focuses on solution approaches for IC designers.\nMORE
LOCATION:Fraunhofer IIS/EAS\, Dresden
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