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Knowledge snack: Edge devices for AI data analysis in industrial plants

Date & Time

from
25/02/202611:30 am
until
25/02/202612:00 pm
duration
30minutes

Location

Type of event
Online / Web-Meeting

Contact

Last name
Ms. Mira Schibbe
Fraunhofer IIS, Institutsteil EAS
email
Fraunhofer_IIS

Intelligent condition monitoring of industrial plants helps companies to recognise faults, problems and wear more quickly and reliably. This saves costs and ensures product quality. For many industrial AI applications, analysing data in the cloud is not an option today. Edge devices are particularly in demand when recording and analysing vibrations on machines due to the high sampling rates of sensor data acquisition. This knowledge snack therefore focuses on edge devices that can be used to record, measure and intelligently process data on technical systems. We present edge devices currently available on the market in compact form and discuss their special features. Application examples will give you an insight into the approaches for a systematic performance evaluation of edge devices for your AI use case.

Speaker: André Schneider, Data Analysis Systems at Fraunhofer IIS in Dresden


More information

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