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How Design for Reliability methods support the development of long-living ICs

Name: How Design for Reliability methods support the development of long-living ICs
Start: 2023-05-24T15:00:00+02:00
End: 2023-05-24T16:00:00+02:00
Location: Fraunhofer IIS/EAS

Online seminar
Evening event
Event
Further training
Networking event
Training

download .ICS file

Date & Time

from: 24/05/202315:00 pm
until: 24/05/202316:00 pm
duration: 1hour

Location

place: Fraunhofer IIS/EAS
city: Dresden Germany

Contact

Last name: Ms. - Marie Noack
Fraunhofer IIS/EAS
email: Znevr.Abnpx@rnf.vvf.senhaubsre.qr

The reliability of integrated circuits (ICs) and electronic systems is becoming increasingly important. This holds for many application scenarios, such as automotive, industrial, medical, communication, etc. Design for Reliability methods allow virtual investigations on the durability of electronics to support the development of reliable ICs and systems. This webinar focuses on solution approaches for IC designers.

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